We distribute this product only in the Czech Republic and Slovakia.

NexView NX2 optical profilometer

Zygo 's NexView NX2 non-contact 3D optical profilometer excels on every surface, from super-smooth optical surfaces to very rough surfaces and stepped structures. The new Smart setup feature allows complete measurement at the touch of a button. The system offers True-color measurement.

Key features

  • Complete measurement at the touch of a button in 1 minute (Smart setup)
  • Non-contact surface metrology without the need to modify the measured element
  • High measurement speed (up to 171 µm/s)
  • True-color imaging
  • Sub-angstrom accuracy
  • Crash protection function to protect the lens against impact
  • Full measurement automation possible
  • Wide selection of lenses
  • 3D interactive surface maps
  • Flexible ISO-compliant metrology analysis
  • Comprehensive proprietary Zygo Mx data visualization and analysis software
Richard Schuster
Expert advisor

Ing. Richard Schuster

+420 601 123 593

schuster@optixs.cz

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OptiXs care

  • We will expertly consult your planned application
  • Our team is able to integrate the product into a larger system
  • We ensure fast delivery of spare parts and local service
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Accessories

Software Mx

Mx řídicí a vyhodnocovací software

Zygo's comprehensive Mx software for interferometer workstation control, data acquisition and subsequent analysis. The programmable environment allows the software and its interface to be optimized as required. The main advantages of the software are:

  • Spherical and aspherical shape evaluation tools.
  • Integrated SPC statistics
  • Interactive 3D maps with zooming, reorientation and other editing options
  • Flexible analysis with a wide range of quantification options, application of filtering functions

Outputs can be manipulated with tolerance settings in accordance with manufacturing standards, making routine measurements easier and faster.

New! With an emphasis on user interface enhancements, you can easily set up new measurements, browse data and measurement results, and diagnose production problems. Mx™ software enables efficient research and development, prototyping and enhances manufacturing applications with easy setup, alignment and one-click measurement capabilities.

Lens

Objektivy k optickým profiloměrům Zygo
Porovnání povrchového profilu měřeného objektivem 1,4x a 100x

The measurement capabilities of optical profilometers depend on the lens used. The lenses determine the magnification, working distance, tilt angle and field of view of the profilometer (not the resolution in the Z-axis direction, which is constant). Choosing the right lens is very important to achieve the measurement objectives.

Zygo offers a wide selection of high performance standard lenses in compact designs with magnifications from 1.4x to special ZWF lenses and lenses with up to 100x magnification.

A complete list of lenses for Zygo optical profilometers.

Application

Parameters

NexView NX2 profilometers are the most powerful next-generation interferometric systems with a unique combination of measurement technologies for large measurement range and speed while maintaining excellent measurement repeatability. CSI(Coherence Scanning Interferometry) and PSI (Phase Shifting Interferometry) modes are uniquely combined so that the user gains the advantage of both approaches simultaneously, eliminating the need to choose between one or the other surface measurement method.

In addition, this optical profilometer, combined with sophisticated software analysis, allows measurement of virtually any surface, including transparent multilayers, coarse and highly polished reflective metal layers, highly scattering surfaces, and many others. All without the need to select a measurement mode. With unique patented technology, simultaneously measure the profile and thickness of thin transparent layers at the same time as measuring the substrate profile.

The NexView NX2 profilometer can be fully automated with a pre-programmed sequence of commands, which can be used for repeated part measurements during quality control or for measuring multiple sample locations in a single measurement. At the touch of a button, a surface profile of the object to be measured can be obtained very quickly and with unrivalled accuracy.

The profiler meets the parameters of the ISO 25178 standard for surface measurements and is also vibration-resistant, so it can be used for measurements in virtually any environment. It measures with sub-nanometer accuracy regardless of the field of view. This non-contact roughness tester enables, among other things, the determination of ISO-compliant roughness, flatness, steppedness, steepness of slope, for height ranges from tenths of a nanometer up to 20 mm.

The supplied Mx™ software allows control of the profilometer and subsequent advanced analysis of the measured data. The results obtained can then be visualized using interactive 3D maps and any deviations from the desired results can be evaluated.

Dokumenty

Nexview NX2 datový list

Nexview NX2 brožura

Inquire product

Are you interested in product? Send us your requirements via the enquiry form or contact an expert consultant directly. We will be happy to answer your questions and propose a solution according to your needs.

Expert advisor

Richard Schuster

Ing. Richard Schuster

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