We distribute this product only in the Czech Republic and Slovakia.

Spectroscopic ellipsometer RC2

The RC2 spectroscopic ellipsometer from J.A. Woollam with its new Dual RCE(Rotating Compensator Ellipsometry) technology enables fast and highly accurate measurements of a wide range of materials such as organic materials, dielectrics, semiconductors and metals. It is a modular system in a PCSCA(Polarizer-Compensator-Sample-Compensator-Analyzer) configuration. With Dual RCE technology, the RC2 measures continuously (no singular points) and with high sensitivity over the entire ellipsometric range.

It is used to characterize thin films and determine optical properties of materials such as complex refractive index and absorption coefficient.

The wide spectral range with variable measurement angle allows characterisation of even multilayer structures.

Key features

  • The most accurate CCD-based ellipsometer
  • Measurement of the complete Mueller matrix
  • Modular design
  • Flexible system integration
  • Dual RCE technology with two rotating compensators
  • Widest spectral range with simultaneous full spectrum detection
  • Measurement capability in both in situ and ex situ configurations

RC2 series ellipsometers are equipped with a fully automated data acquisition system and a motorized workbench that allows sample mapping and layer characterization (homogeneity, roughness, phase transitions, ...).

Richard Schuster
Expert advisor

Ing. Richard Schuster

+420 601 123 593

schuster@optixs.cz

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OptiXs care

  • We will expertly consult your planned application
  • Our team is able to integrate the product into a larger system
  • We ensure fast delivery of spare parts and local service
What else we can help with

Parameters

Design Dual RCE (PCSCA)
Angles of incidence 45°-90° (Automated Angle Base)
20°-90° (Vertical Automated Angle Base)
65° (MicroFocus Base, Fixed Angle/Test Base)
Detector

CCD

Data acquisition speed (total spectrum)

0.3 seconds per complete spectrum

Spectral range

max : 193 - 2500 nm
(full spectrum at once)

  • The RC2 is the first spectroscopic ellipsometer capable of measuring all 16 elements of the Mueller matrix across the entire spectrum, enabling characterization of even the most challenging samples and nanostructures. For example, layers that are depolarizing and anisotropic at the same time can be characterized.
    For example, this allows us to measure liquid crystal multilayers, layers of ordered plasmonic nanoparticles, and many others.
  • The patented design using achromatic rotating compensators is the optimal solution for wide spectral measurement ranges as well as long-term stability, reliability and device lifetime.
  • The modular design allows for variability in measurement configuration, whether you need to map a large sample area with a focused beam for high spatial resolution, or want to measure layer growth in situ, or are interested in flow cell measurements, or just simple spot measurements, one instrument can offer a solution for everything: the RC2.

Combining years of experience and innovative solutions, J.A. Woollam thus presents an instrument with unrivalled capabilities for fast and accurate spectroscopic ellipsometry - both standard (SE), generalized (g-SE) and complete Mueller matrix (MM-SE).

Dokumenty

RC2 Brožura

Novinky

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Application

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Are you interested in product? Send us your requirements via the enquiry form or contact an expert consultant directly. We will be happy to answer your questions and propose a solution according to your needs.

Expert advisor

Richard Schuster

Ing. Richard Schuster

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