Zygo, the world leader in interference profilometers and laser interferometers, is launching a new generation of modular optical profilometers , the NewView 9000, along with a new and improved flagship product, the Nexview NX2.

Compared to the previous generation, not only the hardware has received significant improvements, but also the proprietary Zygo Mx™ software for both measurement control and advanced data analysis.

The major HW innovation is the addition of a new sensor that will provide:

Users can also look forward to many software enhancements, led by the unique Smart Setup innovation. This feature minimizes operator effort and significantly reduces measurement time: the new generation can go from sample settling to complete metrology data in under 1 minute on the vast majority of surfaces.

The key SW innovations are:

These improvements result in a significant increase in measurement speed with higher accuracy, higher productivity. New software features such as Fast Focus, Part Finder and Smart Setup lead to a significant reduction in operator effort and faster measurements. The new features also allow for even higher levels of automation.

Contrast enhancements for intensity patterns provide a better basis for 2D image data analysis.

The new generation of profilers can also be used to measure transparent coatings, including the ability to simultaneously measure the profile of the transparent coating, its thickness and the substrate profile. In addition, the Nexview NX2 version offers the option of True Color mode measurements to display the microscopic surface profile in true color.

Of course, all the options that users are accustomed to remain, such as measurement and evaluation according to ISO standards as well as user-defined regulations with scripting capabilities.