Spectroscopic ellipsometer M-2000 from the world's leading manufacturer of spectroscopic ellipsometers J.A.Woollam Co.
It is an ellipsometer assembly with motorized goniometer for angular measurements and motorized feeds for sample mapping. By combining a fast CCD detector and patented RCE technology (rotating compensator ellipsometry), the M-2000 allows the M-2000 to measure ellipsometric data from the entire spectral range (here 245 - 1690 nm) with extreme sensitivity in a fraction of a second.
The offered system has versatile applications and is an ideal tool for studying the optical properties of thin films and multilayers, their uniformity, investigating nanostructures, detecting surface phase transitions, and measuring free charge carrier concentrations. It provides the possibility to investigate the band structure (including critical points), the possibility of non-destructive investigation of the refractive index profile in super-thin layers, enables the measurement of fast processes (e.g. layer deposition) and other...
The state-of-the-art CompleteEase software greatly facilitates the handling of ellipsometric data, offering the widest range of analytical models and a library of optical characterizations of a wide range of materials.
Device parameters
- Spectral range: 245 - 1690 nm
- Angular range: 45° - 90°
- Number of measurable MM elements: 12
- Measurement time for complete spectrum: < 0.1 s
- Motorized shifts: YES (100 mm x 100 mm range)
- Sample Mapping: YES
- Microfocusing attachments: YES (2 pieces)
- Sample preview camera: YES
