The alpha 2.0 spectroscopic ellipsometer is the successor to the successful and affordable alpha-SE model from J.A. Woollam.
A solution for routine thickness and refractive index measurements of thin films. The combination of compact size and simple design allows for easy operation, while maintaining maximum spectroscopic ellipsometry performance.
The novelty of the patented dual rotation technology guarantees high accuracy of ellipsometric measurements including the Mueller Matrix.
Key Features:
- Easy to use
- Fast full spectrum measurement thanks to CCD detector
- Affordable price
- New generation with patented dual rotation technology
Visit the product page for more information about the new product: HERE.
