The Jupiter XR AFM from Asylum Research is the first and only atomic force microscope for large samples that offers an uncompromising combination of high measurement speeds with an extended scanning range within a single scanner. The Jupiter XR Provides access to the complete surface of up to 200mm samples at high resolution with a fast process from sample insertion to accurate results. Faster data, easier user interface, versatility - this sets the Jupiter XR apart from the competition and offers excellent performance for academic and industrial research and development.
Application
Typical application areas:
- Semiconductors
- Microelectronics
- Photovoltaics and energy storage
- Tribology & corrosive processes
- Polymers
- 2D materials
Key Features
- Speed & accuracy
- Reliable metrology
- Easy operation and automation
- Large scanning range
