We invite you to another SIOS Messtechnikwebinar to learn more about high-precision metrology based on laser interferometry. The webinar will take place on 30 September, at two times: 8:30 and 15:30.

Technological innovations of recent years generally follow the same pattern: products become more complex and powerful, demands on design quality become more stringent, while system size decreases. The demand is for high-performance, high-quality and compact devices.

With the growing interest in micro- and nanotechnology in the industrial sectors comes high demands for measuring instruments that are used in manufacturing, testing and positioning. Nanoscale metrology has thus found its wayinto a wide range of fields inrecent years - from the semiconductor industry and nanoelectronics to micro-optics, genetic engineering, molecular biology and materials research.

In this webinar, experts Dr. Denis Dontsov and Enrico Langlotz will take you through the following topics in 45 minutes :

At the same time , you will receive comprehensive guidance on how to properly use SIOS systems in your applications. Sios will also present its NMM multisensor system for complex 3D metrology at the nanoscale.

After the presentation there will be a discussion area where the specialists will be happy to answer all your questions.

For more information about the event, including registration forms, please click HERE or you can register directly via the links below:

We look forward to seeing you there!


RECORDING OF THE WEBINAR