Zygo 's Compass™ 2nd generation metrology systems set a new standard for automated non-contact 3D surface metrology and process control for microlenses and molds that are critical for compact camera modules used in smartphones, tablets and automotive vision systems. They are based on Zygo's Coherent Scanning Interferometry(CSI) technology, which provides superior accuracy, versatility and speed for repeatable metrology and manufacturing process control.
Key Features
- Zygo's proven CSI technology
- Non-contact surface metrology without the need to modify the feature being measured
- Can be integrated into a DTM
- High measurement speed
- Sub-nanometer accuracy
- High-resolution 3D interactive map of the entire surface
- Fully autonomous measurement
- Crash protection function to protect the lens against impacts
- Metrology also for free-form and aspheric surfaces
- Comprehensive Zygo Mx data visualization and analysis software